McClung, R. W.
Group leader, Oak Ridge National Laboratory, Oak Ridge, Tenn.
Pages: 12 Published: Jan 1968
Low-voltage radiography was studied to provide optimum techniques for graphite thickness less than 2 in. Significant improvements were made in image quality and sensitivity by use of an intermediate atmosphere of helium, bare film, and a thin beryllium-window X-ray tube. Use of a high resolution photographic emulsion allows contact microradiography to be performed on miniature specimens with a resolution of one micron.
X-ray analysis, radiography, microradiography, graphite, coatings
Paper ID: STP45889S