STP384: Transient Radiation Effects in Semiconductor Devices

    Crowe, J. W.
    Radiation Effects, North American Aviation, Inc., Canoga Park, Calif.

    Sauer, A. J.
    Radiation Effects, North American Aviation, Inc., Canoga Park, Calif.

    Pages: 39    Published: Jan 1965


    Abstract

    Transistors in conventional simple circuits were exposed to bursts of x-radiation from a 600 Kv flash x-ray machine. Analyses of the circuit responses are given in terms of electrical equivalent circuits. Electrical and radiation tests are compared.


    Paper ID: STP44607S

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP44607S


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