Digital Library / STP / STP384-EB / STP44607S

Transient Radiation Effects in Semiconductor Devices

Crowe, J. W.
Radiation Effects,North American Aviation, Inc.,Calif.,

Sauer, A. J.
Radiation Effects,North American Aviation, Inc.,Calif.,

Pages: 39    Published: Jan 1965

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Source: STP384-EB

Abstract

Transistors in conventional simple circuits were exposed to bursts of x-radiation from a 600 Kv flash x-ray machine. Analyses of the circuit responses are given in terms of electrical equivalent circuits. Electrical and radiation tests are compared.

Keywords:


Paper ID: STP44607S
Committee/Subcommittee: E10.07
DOI: 10.1520/STP44607S
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