STP384

    Transient Radiation Effects in Semiconductor Devices

    Published: Jan 1965


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    Abstract

    Transistors in conventional simple circuits were exposed to bursts of x-radiation from a 600 Kv flash x-ray machine. Analyses of the circuit responses are given in terms of electrical equivalent circuits. Electrical and radiation tests are compared.


    Author Information:

    Crowe, J. W.
    Radiation Effects, North American Aviation, Inc., Canoga Park, Calif.

    Sauer, A. J.
    Radiation Effects, North American Aviation, Inc., Canoga Park, Calif.


    Paper ID: STP44607S

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP44607S


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