Published: Jan 1964
| ||Format||Pages||Price|| |
|PDF ()||10||$25||  ADD TO CART|
|Complete Source PDF (6.7M)||10||$55||  ADD TO CART|
In order to emphasize the value of point-projection X-ray microscopy for resin research, examples of data obtainable with simple equipment are presented. These data were collected from opaque, porous, and fibrous structures.
Newman, Sanford B.
Polymer Characterization Section, National Bureau of Standards, Washington, D. C.