Transmission phase microscopy is widely employed by resinographers to clarify the structural details of transparent, colorless resins characterized only by differing refractive indexes. On the other hand, incident phase microscopy is virtually unknown to the resinographer and has been confined primarily to the province of the metallographer. This is unfortunate since the instrumentation can supply unique and useful information for solving many resinographic problems. Illustrative problems in which incident phase microscopy was gainfully employed to obtain a solution are presented.