SEDL / STP / STP342-EB / STP44488S

An Instrument for the Contactless Measurement of Minority Carrier Lifetime

Currin, C. G.
Dow Corning Corp., Hemlock, Mich.

Smith, F. A.
Dow Corning Corp., Midland, Mich.

Pages: 8    Published: Jan 1963

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Abstract

Minority carrier lifetime indicates the purity of semiconductor materials. Whereas resistivity is a measure of the concentration of impurities with an energy level near either the valence or conduction band, lifetime is affected most by impurities that have an energy level near the middle of the band gap. Thus lifetime data indicate the presence of impurities and imperfections other than those indicated by resistivity data (1).