STP157: Basic Theory and Fundamentals of Fluorescent X-ray Spectrographic Analysis

    Friedman, H
    Naval Research Laboratory, Washington, D. C.

    Birks, L S
    Naval Research Laboratory, Washington, D. C.

    Brooks, E J
    Naval Research Laboratory, Washington, D. C.

    Pages: 24    Published: Jan 1954


    Abstract

    The basic principles of X-ray spectral analysis were set forth in many publications (1)2 that appeared in the years between 1912 and 1930, and the method had its most notable successes in the discoveries of the missing elements of the periodic system. Operation of X-ray equipment, however, required rather specialized skills and X-ray spectroscopy never came into general use as a means of chemical analysis. The current revival of interest in X-ray spectrochemical analysis may be attributed largely to the replacement of photographic photometry by electronic methods of intensity measurement. Other contributing factors are the availability of high intensity sealed-off X-ray tubes and well-stabilized power supplies. Spectrographs developed during the past few years have proven very successful in the analysis of elements of atomic numbers greater than 22. The extension of X-ray analysis to lighter elements should prove equally profitable with the development of high-vacuum and helium-filled spectrographs.


    Paper ID: STP44074S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP44074S


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