STP155: Techniques that Permit Successive Examinations of Specific Areas by Electron Microscopy

    McLauchlan, T. A.
    Research Technologist, Research and Development Laboratory, United States Steel Corp., Pittsburgh, Pa.

    Pages: 5    Published: Jan 1954


    Abstract

    In microscopy, techniques for relocating specific areas of a specimen are desirable for several reasons. First, such techniques permit a comparison of the microstructures developed by various etchants in a particular location in a sample. Second, they permit investigation of the progress of phase transformation in a given region of a specimen after various processing treatments, such as annealing, tempering, or aging. Finally, such techniques permit, for identical fields of view, a comparison of electron micrographs with corresponding light micrographs.


    Paper ID: STP44067S

    Committee/Subcommittee: E04.03

    DOI: 10.1520/STP44067S


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