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In Situ Dielectric Property Measurements in Simulated Space Environments Pages: 32 Published: Jan 1967
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View License Agreement Source: STP420-EB Abstract Three methods that we are using to make in situ measurements of complex permittivity over a broad frequency range are discussed along with some test results. The methods would appear to be suitable not only for experiments in simulated space environments, but also for outer space, in “space dielectrometers” suitably instrumented for terrestrial readout and data reduction. At low frequencies (1 kHz), a planar capacitor technique is used with conventional null method and capacitance bridge. At microwave frequencies (9 GHz), a vacuum TE01n resonant cavity is used. At millimeter wavelengths (35 GHz), a dielectric rod technique is employed. Keywords: capacitance, cavity resonators, conductivity, dielectric constant, dielectrometers, dissipation factor, radiation, loss tangent, microwaves, millimeter waves, permittivity, radiation effects, resistivity, resonance, space environment, ultraviolet radiation, vacuum chambers, electrical properties Paper ID: STP43802S Committee/Subcommittee: D09.12 DOI: 10.1520/STP43802S ASTM International is a member of CrossRef. | ||