STP420: In Situ Dielectric Property Measurements in Simulated Space Environments

    Escoffery, C. A.
    Senior technical staff assistant, Hughes Aircraft Co., Culver City, Calif

    Pages: 32    Published: Jan 1967


    Abstract

    Three methods that we are using to make in situ measurements of complex permittivity over a broad frequency range are discussed along with some test results. The methods would appear to be suitable not only for experiments in simulated space environments, but also for outer space, in “space dielectrometers” suitably instrumented for terrestrial readout and data reduction. At low frequencies (1 kHz), a planar capacitor technique is used with conventional null method and capacitance bridge. At microwave frequencies (9 GHz), a vacuum TE01n resonant cavity is used. At millimeter wavelengths (35 GHz), a dielectric rod technique is employed.

    Keywords:

    capacitance, cavity resonators, conductivity, dielectric constant, dielectrometers, dissipation factor, radiation, loss tangent, microwaves, millimeter waves, permittivity, radiation effects, resistivity, resonance, space environment, ultraviolet radiation, vacuum chambers, electrical properties


    Paper ID: STP43802S

    Committee/Subcommittee: D09.12

    DOI: 10.1520/STP43802S


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