SEDL / STP / STP420-EB / STP43797S

Problems with Dielectric Measurements at Cryogenic Temperatures

Mathes, K. N.
Insulation systems engineer, General Chemistry Laboratory, General Electric Co., Schenectady, N.Y.

McGowan, E. J.
Raychem Corp., Redwood City, Calif.

Pages: 15    Published: Jan 1967

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Abstract

Problems with measurements at cryogenic temperatures are described. The long leads which are needed to reach to the bottom of the cryostat introduce a number of difficulties. The very low dielectric losses which may be encountered pose special measurement problems. Optimized solutions to these and other problems are described.