SEDL / STP / STP420-EB / STP43797S

Problems with Dielectric Measurements at Cryogenic Temperatures

Mathes, K. N.
Insulation systems engineer, General Chemistry Laboratory, General Electric Co., Schenectady,N.Y.

McGowan, E. J.
Raychem Corp., Redwood City,Calif.

Pages: 15    Published: Jan 1967

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Source: STP420-EB

Abstract

Problems with measurements at cryogenic temperatures are described. The long leads which are needed to reach to the bottom of the cryostat introduce a number of difficulties. The very low dielectric losses which may be encountered pose special measurement problems. Optimized solutions to these and other problems are described.

Keywords:
dielectric measurements, electrical properties, space environment, cryogenics, low temperature

Paper ID: STP43797S
Committee/Subcommittee: D09.17
DOI: 10.1520/STP43797S
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