Published: Jan 1962
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The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.
Heise, B. H.
Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.
Paper ID: STP43686S