STP317: X-Ray Diffraction in the Electron Probe Microanalyzer

    Heise, B. H.
    Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.

    Pages: 8    Published: Jan 1962


    Abstract

    The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.


    Paper ID: STP43686S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP43686S


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