SEDL / STP / STP317-EB / STP43686S

X-Ray Diffraction in the Electron Probe Microanalyzer

Heise, B. H.
Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.

Pages: 8    Published: Jan 1962

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Abstract

The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.