STP317

    X-Ray Diffraction in the Electron Probe Microanalyzer

    Published: Jan 1962


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    Abstract

    The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.


    Author Information:

    Heise, B. H.
    Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.


    Paper ID: STP43686S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP43686S


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