STP336

    A Submicrosecond Technique for Simultaneous Observation of Input and Propagated Impact Stresses

    Published: Jan 1963


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    Abstract

    By impacting a quartz gage on a disk-shaped specimen in a precisely controlled flat-faced projectile impact, the stress-time history of the specimen material at the impact surface can be observed. In this manner the mechanical behavior of the material in one-dimensional strain can be studied separate from wave propagation effects for times as short as 10-8 sec and for stress amplitudes up to at least 21 kilobars. Simultaneously, the stress-time profile of the resulting wave after a finite propagation distance can be obtained from another quartz gage mounted on the opposite face of the specimen. The gages are X-cut quartz disks having a thickness such that wave transit time through the disk is much greater than time variations in stress. Under the conditions of use the instantaneous short-circuit current from a gage is proportional to the specimen-to-gage interface stress. Records of input and propagated stresstime profiles are shown for aluminum and barium titanate. The technique isparticularly adaptable to studies of the dynamic yield behavior of materials.


    Author Information:

    Halpin, W. J.
    Staff Member, Sandia Corp., Albuquerque, N. Mex.

    Jones, O. E.
    Staff Member, Sandia Corp., Albuquerque, N. Mex.

    Graham, R. A.
    Staff Member, Sandia Corp., Albuquerque, N. Mex.


    Paper ID: STP42031S

    Committee/Subcommittee: D20.10

    DOI: 10.1520/STP42031S


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