SEDL / STP / STP223-EB / STP41996S



Nickel Thickness Gage

Cook, Louis H.
Savannah River Laboratory, E. I. du Pont de Nemours & Co., Aiken, S. C.


Pages: 6    Published: Jan 1958


Download this paper for $25 PDF (128K)          View License Agreement
Abstract

The thickness of a nickel film can be determined by measuring the force required to pull a small magnet free of the surface; however, inconsistent and unreliable results were obtained with this type of measurement when the film was extremely thin and the surface slightly rough. The magnetic properties of nickel suggested that a reluctance technique of measurement could be used to determine the thickness of the nickel.


Paper ID: STP41996S
Committee/Subcommittee: E07.07
DOI: 10.1520/STP41996S
CrossRef ASTM International is a member of CrossRef.