STP430: Evaluation Study of Various Standard X-Ray Powder Diffraction Techniques

    Thomassen, L.
    Professor, University of Michigan, Ann Arbor, Mich.

    Rinn, H. W.
    Powder Diffraction Laboratory, the Dow Chemical Co., Midland, Mich.

    Hanawalt, J. D.
    ProfessorPersonal member ASTM, University of Michigan, Ann Arbor, Mich

    Pages: 15    Published: Jan 1968


    Abstract

    Two master mixes of two components each were submitted to eleven different X-ray laboratories for purposes of determining the scatter in d-values and intensities of diffraction data to be expected in routine operations. The results obtained on the two master mixes by ten different diffractometers, five different Debye-Scherrer cameras, and two monochromatic focussing cameras are summarized. Reproducibility of d-values and relative intensities is very high for techniques under good adjustments. The general superiority of data from focussing monochromatic cameras compared to the Debye-Scherrer cameras is illustrated, as well as the diversity observed in diffractometer units. Some statistical data are included relating to the uniqueness of powder diffraction data for identifying crystalline substances.

    Keywords:

    metallography, X-ray, diffraction, powder diffraction, crystallography


    Paper ID: STP41821S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP41821S


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