STP430: The Case for a Universal X-Ray Diffraction Intensity Scale

    Scott, R. K.
    Research scientist, Harbison-Walker Refractories Co., Pittsburgh, Pa.

    Pages: 3    Published: Jan 1968


    Abstract

    A universal intensity scale, for X-ray diffraction, which will relate the intensity of the strongest line of any compound to the strongest line of a standard substance, is proposed for inclusion in the X-Ray Powder Data File. Corundum, alpha-aluminum oxide, is a suitable reference standard. Advantages of the scale, as well as some precautions in using it, are discussed.

    Keywords:

    X-ray diffraction, intensity, crystallography, metallography


    Paper ID: STP41820S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP41820S


    CrossRef ASTM International is a member of CrossRef.