SEDL / STP / STP430-EB / STP41820S

The Case for a Universal X-Ray Diffraction Intensity Scale

Scott, R. K.
Research scientist, Harbison-Walker Refractories Co., Pittsburgh, Pa.

Pages: 3    Published: Jan 1968

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Abstract

A universal intensity scale, for X-ray diffraction, which will relate the intensity of the strongest line of any compound to the strongest line of a standard substance, is proposed for inclusion in the X-Ray Powder Data File. Corundum, alpha-aluminum oxide, is a suitable reference standard. Advantages of the scale, as well as some precautions in using it, are discussed.