STP430: A Mid-Century of Metallography-Retrospect and Aspect

    Wyman, L. L.
    ChairmanPersonal member ASTM, Committee E-4, ASTM,

    Pages: 16    Published: Jan 1968


    Abstract

    This introductory presentation is devoted primarily to the “how and why” of ASTM Committee E-4 organization, and the impelling reasons for its material expansion of activities into many spheres of effort that now are a part of modern metallography. Committee E-4 began as a committee on microscope magnifications; then, as other means of structure analysis became available, it has always been in the forefront to establish organized effort to develop these methods. This has not only led to the expansion of subcommittee activities within E-4, but even more importantly, has instigated the formation of other technical committees of the Society such as E-7 on Nondestructive Testing and the Joint Committee on Powder Diffraction Standards which sponsors the Standard X-ray Diffraction Index which is recognized world-wide. The inherent concern of E-4 in microstructure is still manifest in its Photomi-crographic Exhibit each “show-year,” and which is of outstanding excellence because of the basic requirement that entries be instructive, rather than merely “attractive.” An early appreciation of the potentialities of electron micrography caused E-4 to initiate organized effort in this field, not only making outstanding contributions to the techniques and literature in this field through a series of STP's but which also led directly to the subsequently developed spheres of activity in electron microprobe and ion emission microscopy. The inception of these various fields of effort herein mentioned, as well as several others, are directly correlated with the technical papers presented in this symposium.

    Keywords:

    metallography, microscopy, history, microstructure


    Paper ID: STP41812S

    Committee/Subcommittee: E04.92

    DOI: 10.1520/STP41812S


    CrossRef ASTM International is a member of CrossRef.