SEDL / STP / STP339-EB / STP41266S

Electron Probe Microanalysis: A New Method of Calculating Absorption Correction

Philibert, Jean
IRSID, SaintGermain-en-Laye,

Pages: 3    Published: Jan 1963

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Abstract

In electron probe microanalysis, the measured X-ray intensities are proportional to the concentrations as corrected for secondary effects, namely self-absorption and fluorescence.