STP339: Electron Probe Microanalysis: A New Method of Calculating Absorption Correction

    Philibert, Jean
    IRSID, SaintGermain-en-Laye,

    Pages: 3    Published: Jan 1963


    In electron probe microanalysis, the measured X-ray intensities are proportional to the concentrations as corrected for secondary effects, namely self-absorption and fluorescence.

    Paper ID: STP41266S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP41266S

    CrossRef ASTM International is a member of CrossRef.