Borofsky, Arnold J.
Section Head, Reliability Engineering and Analysis, Sylvania Electric Products, Inc., Woburn, Mass.
Pages: 11 Published: Jan 1961
Changes in the ICBO, Iebo and hFE reliability of germanium alloy transistors (npn and pnp computer types) as a result of etching, washing, and encapsulation processing have been investigated beyond 2500 hr. Data following operation at maximum rated power and 100 C storage data are presented for hydrogen peroxide and modified hydrogen peroxide etching solutions; for tank and turbulent washing; and for five types of fluid-base and three types of dry encapsulants.
Paper ID: STP41245S