STP300

    The Role of Impurities in Impurity-Dominated Electronic Materials and Devices

    Published: Jan 1961


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    Abstract

    It is privilege to open this National Technical Meeting of the American Society for Testing Materials, dealing with the interaction of ASTM with the electronics industry.


    Author Information:

    Biondi, F. J.
    Vice-Chairman, Bell Telephone Laboratories, Inc.Committee F-1 on Materials for Electron Tubes and Semiconductor Devices, Murray Hill, N. J.


    Paper ID: STP41217S

    Committee/Subcommittee: F01.10

    DOI: 10.1520/STP41217S


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