STP300: The Role of Impurities in Impurity-Dominated Electronic Materials and Devices

    Biondi, F. J.
    Vice-Chairman, Bell Telephone Laboratories, Inc.Committee F-1 on Materials for Electron Tubes and Semiconductor Devices, Murray Hill, N. J.

    Pages: 3    Published: Jan 1961


    Abstract

    It is privilege to open this National Technical Meeting of the American Society for Testing Materials, dealing with the interaction of ASTM with the electronics industry.


    Paper ID: STP41217S

    Committee/Subcommittee: F01.10

    DOI: 10.1520/STP41217S


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