Published: Jan 1976
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Ion scattering and Auger spectrometry have proven to be useful analytical techniques for elemental analysis of surface composition. However, few, if any, previous studies have been made to show the variations that exist between the two analytical techniques. To better illustrate the difference in results between the two analytical techniques, a series of thin film evaporated coatings were prepared on different substrates for examination and analysis on both the ion scattering spectrometer (ISS) and Auger electron spectrometer (AES). Some basic agreement between the two techniques is noted; however, the variation with substrate and extraneous element concentrations shows that the characterization of material surfaces using ISS and AES demands further investigation and development before quantitative analyses can be attempted.
spectroscopy, surface analysis, ion scattering, evaporated thin film, quantitative analysis, materials tests
Senior research physicist, National Steel Corporation, Research Center, Weirton, W. Va.