STP699: Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys

    Conner, GR
    Surface analysis applications manager, Inficon Leybold-Heraeus, Inc., East Syracuse, New York

    Pages: 12    Published: Jan 1980


    Abstract

    Electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) analyses were conducted on oxide films formed at room temperature on iron-nickel-chromium alloys. Results are given for controlled oxidation of sputter-cleaned surfaces with highly pure oxygen and sequential analysis by the three techniques. Mixed iron-chromium oxide films of approximately 25 Å were formed at 0.67 to 0.93 µPa∙s. ESCA and SIMS results confirm the initial formation of a mixed iron-chromium trivalent oxide ((Fe,Cr)2O3) and suggest that a mixed divalent iron—trivalent chromium oxide (FeCr2O4) is also formed in the oxide film.

    Keywords:

    surface analysis, Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), electron spectroscopy for chemical analysis (ESCA), secondary ion mass spectrometry (SIMS), oxide film analysis, iron-nickel-chromium alloys


    Paper ID: STP38652S

    Committee/Subcommittee: E42.03

    DOI: 10.1520/STP38652S


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