SEDL / STP / STP699-EB / STP38652S

Comparative AES, ESCA, and SIMS Investigation of Oxide Films on Iron-Nickel-Chromium Alloys

Conner, GR
Surface analysis applications manager, Inficon Leybold-Heraeus, Inc., East Syracuse, New York

Pages: 12    Published: Jan 1980

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Abstract

Electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) analyses were conducted on oxide films formed at room temperature on iron-nickel-chromium alloys. Results are given for controlled oxidation of sputter-cleaned surfaces with highly pure oxygen and sequential analysis by the three techniques. Mixed iron-chromium oxide films of approximately 25 Å were formed at 0.67 to 0.93 µPa∙s. ESCA and SIMS results confirm the initial formation of a mixed iron-chromium trivalent oxide ((Fe,Cr)²O³) and suggest that a mixed divalent iron—trivalent chromium oxide (FeCr²O⁴) is also formed in the oxide film.