Published: Jan 1971
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The multichannel analyzer role in X-ray spectrometer analysis has been taking on an ever increasing importance. Complete energy spectra observations are now possible from a single scan of a specimen with electron microscope.
The scope of this paper will be to interpret these spectral data in terms of accuracy, parameters, and usefulness to the X-ray spectrometer user. A set of general specifications will be outlined for the multichannel analyzer to cope with the ever changing requirements of the user and developments of the manufacturer.
With this aid it is the hope that the users of the multichannel analyzers will be able to incorporate units in their system that will perform the present and future functions of their applications.
X-ray spectrometers, analog computers, digital computers, electron microscopy, X-ray spectra, X-ray analysis, address scaler, analog to digital converter, analysis mode, base line restorer, binary coded decimal, coincidence input, conversion gain, differential linearity, digital overflow, digital zero offset, display mode, input signal, integral linearity, linear gate, lower level discriminator, magnetic core memory, memory, memory cycle, memory data scaler, multichannel analyzer, multichannel scaling, parallel entry memory, pulse amplitude to time converter, pulse height analyzer, readout mode, serial entry memory, single channel analyzer, stretcher capacitor, upper level discriminator, evaluation, tests
Vice president, Northern Scientific, Inc., Middleton, Wis.
Paper ID: STP38571S