SEDL / STP / STP485-EB / STP38567S



The Future of Silicon X-Ray Detectors

Aitken, DW
Chairman, San Jose State College, San Jose, Calif

Woo, E
Technical director, the Kevex Corporation, Burlingame, Calif


Pages: 21    Published: Jan 1971


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Abstract

The future potential for silicon X-ray detectors is appraised in view of recent accomplishments, present trends, and present physical knowledge. The discussion includes achievements in resolution with both small and large area detectors, and at both low and high count rates. Differences are emphasized between theoretical capability and experimental practicality, with the dual aim of helping the experimenter to evaluate the potential of silicon X-ray spectrometers in his own work, and of guiding him toward experimental design concepts that might enable him to make the maximum use of the available electronic and detector performance capabilities. The present advantages of silicon over germanium for X-ray energies below about 40 keV are discussed.


Keywords:
solid state counters, silicon, germanium, spectrometers, X-ray spectra, X-ray spectrometers, X-ray fluorescence, energy absorption, resolution, dispersion, radiation measuring instruments

Paper ID: STP38567S
Committee/Subcommittee: E04.11
DOI: 10.1520/STP38567S
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