Published: Jan 1971
| ||Format||Pages||Price|| |
|PDF Version (644K)||33||$25||  ADD TO CART|
|Complete Source PDF (6.3M)||33||$86||  ADD TO CART|
Energy spectrometry utilizing a solid-state detector (silicon) for X-ray elemental analysis is described, and compared with wavelength spectrometry.
Parameters which influence the spectrometers energy resolution, energy detection range, and countrate capabilities are reviewed. Measured performance of a spectrometer (200 eV FWHM resolution for 6.404 keV radiation) is demonstrated for both X-ray and electron specimen excitation.
spectroscopy, spectrometers, X-ray spectrometers, chemical analysis, X-ray spectra, X-ray analysis, electron probes, energy bands, wavelength, X-ray fluorescence, solid state counters, silicon, dispersing
Lecturer, Applied Physics and Information Science, University of California, San Diego, Calif
Chemist, Gulf General Atomic Incorporated, San Diego, Calif
Paper ID: STP38566S