STP799

    Recent Progress in the Studies of Laser-Induced Intrinsic Damage of Transparent Solids: Deterrent Lack Effect of Seed Electrons in Avalanche Ionization Process

    Published: Jan 1983


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    Abstract

    Peculiarities of laser-induced damage in transparent dielectrics caused by electron avalanche in the case of deterrent lack of seed electrons are discussed. Statistical models of the avalanche process initiated by multiphoton ionization of host atoms or impurities are described. Based on the breakdown probability expressions derived, the damage threshold dependence upon the temperature and the focal spot size are discussed. The theoretical results are found to be in good qualitative agreement with the experimental data for the laser-induced damage in alkali-halide crystals.

    Keywords:

    avalanche ionization, breakdown probability, seed electrons, spot-size dependence, temperature dependence


    Author Information:

    Epifanov, AS
    Lebedev Physical Institute of the USSR Academy of Sciences, Moscow,

    Garnov, SV
    Lebedev Physical Institute of the USSR Academy of Sciences, Moscow,

    Gomelauri, GV
    Lebedev Physical Institute of the USSR Academy of Sciences, Moscow,

    Manenkov, AA
    Lebedev Physical Institute of the USSR Academy of Sciences, Moscow,

    Prokhorov, AM
    Lebedev Physical Institute of the USSR Academy of Sciences, Moscow,


    Paper ID: STP37279S

    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP37279S


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