STP799: Cavity Phase Shift Method For High Reflectance Measurements

    Kwok, MA
    The Aerospace Corporation, Los Angeles, CA

    Herbelin, JM
    The Aerospace Corporation, Los Angeles, CA

    Ueunten, RH
    The Aerospace Corporation, Los Angeles, CA

    Segal, GI
    The Aerospace Corporation, Los Angeles, CA

    Pages: 6    Published: Jan 1983


    Abstract

    The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 microns wavelength is described. A reflectance of 0.9920 ± .0050 has been measured.

    Keywords:

    laser applications, mid-infrared optics, reflectance measurement


    Paper ID: STP37242S

    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP37242S


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