SYMPOSIA PAPER Published: 01 January 1983
STP37242S

Cavity Phase Shift Method For High Reflectance Measurements

Source

The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 microns wavelength is described. A reflectance of 0.9920 ± .0050 has been measured.

Author Information

Kwok, MA
The Aerospace Corporation, Los Angeles, CA
Herbelin, JM
The Aerospace Corporation, Los Angeles, CA
Ueunten, RH
The Aerospace Corporation, Los Angeles, CA
Segal, GI
The Aerospace Corporation, Los Angeles, CA
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: F01
Pages: 199–204
DOI: 10.1520/STP37242S
ISBN-EB: 978-0-8031-4865-9
ISBN-13: 978-0-8031-0708-3