SEDL / STP / STP799-EB / STP37242S


Cavity Phase Shift Method For High Reflectance Measurements

Kwok, MA
The Aerospace Corporation, Los Angeles, CA

Herbelin, JM
The Aerospace Corporation, Los Angeles, CA

Ueunten, RH
The Aerospace Corporation, Los Angeles, CA

Segal, GI
The Aerospace Corporation, Los Angeles, CA


Pages: 6    Published: Jan 1983


Download this paper for $25 PDF (128K)          View License Agreement
Abstract

The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 microns wavelength is described. A reflectance of 0.9920 ± .0050 has been measured.


Keywords:
laser applications, mid-infrared optics, reflectance measurement

Paper ID: STP37242S
Committee/Subcommittee: F01.02
DOI: 10.1520/STP37242S
CrossRef ASTM International is a member of CrossRef.