SYMPOSIA PAPER Published: 01 October 1981
STP37020S

Survey of Damage Thresholds at 532 NM for Production-RUN optical Components

Source

We report the results of a survey of 532-nm, 0.7-ns damage thresholds for a variety of optical components. The optics were all samples from current production runs, which included high-reflector and anti-reflector films, beam dumps, leached AR surfaces, and multiwavelength AR and HR films.

The experiment was similar to the usual 1064-nm damage measurement. The green light pulses were produced by frequency-doubling 1-ns pulses from a Nd:glass laser. The 532-nm beam was then focused to a spot size of about 2 mm diameter at the sample. Beam profiles were recorded on a vidicon and on 1-Z photographic plates.

Thresholds for the AR and HR films were typically 2–5 J/cm2, somehwat lower than might have been expected. Some of the beam dumps damaged at 2 J/cm2. Bare and graded-index surface thresholds were found to be comparable to 1-ns, 1064-nm thresholds.

Author Information

Deaton, TF
Rainer, F
Milam, D
Smith, WL
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Details
Developed by Committee: F01
Pages: 297–299
DOI: 10.1520/STP37020S
ISBN-EB: 978-0-8031-4820-8
ISBN-13: 978-0-8031-4500-9