STP759

    Multiple-Shot Laser Damage Thresholds of Ultraviolet Reflectors at 248 and 308 Nanometers

    Published: Oct 1981


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    Abstract

    Multiple-shot damage thresholds of dielectric reflectors have been measured at 248 and 308 nm. Standard irradiation conditions were a 10-ns pulsewidth, 0.6-mm spot diameter and 35-Hz pulse repetition frequency. The reflectors, from various sources, were composed of oxide and fluoride films.

    Although damage was generally initiated at visible film defects, there was no correlation between damage susceptibility and the appearance of these defects. At levels near threshold, damage was most often observed as an increase in white-light scatter of a site with no growth upon continued irradiation; at higher levels, the damage site grew with successive shots.

    Test sites were subjected to at least 103 shots and some sites received as many as 2.5 × 104 shots; however, with only one exception damage was found to occur within the first few shots or not at all.

    Reflectors at 248 nm typically had damage thresholds in the 1.0–1.8 J/cm2 range with two samples exhibiting unexpectedly high thresholds of 2.8 and 3.0 J/cm2. In some cases, a subthreshold pre-irradiation treatment resulted in a 20–25% enhancement in damage resistance.

    Keywords:

    Excimer lasers, fluoride coatings, laser damage, multiple-shot damage, oxide coatings, pre-irradiation, thin films, ultraviolet reflectors


    Author Information:

    Foltyn, SR
    Los Alamos Scientific Laboratory, Los Alamos, New Mexico

    Newnam, BE
    Los Alamos Scientific Laboratory, Los Alamos, New Mexico


    Paper ID: STP37017S

    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP37017S


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