STP677

    Measurement of Crack-Tip Stress Distributions by X-Ray Diffraction

    Published: Jan 1979


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    Abstract

    Crack-tip stress distributions were measured on the surface of fatigue-cracked specimens of 1045 steel using a semiautomatic X-ray diffraction technique. The influence of overload cycles and crack extension on crack-tip stress profiles was studied. These overload-influenced stress profiles were observed to follow current analytical models generally. Overload cycles were shown to have a strong effect on subsequent residual and applied stress profiles. It was deduced that overload-induced crack-tip residual stresses are tensile on the interior of the specimen, the implication being that crack growth retardation may thus be a surface related phenomenon. Crack tip applied stresses were also measured and were found to be consistent with simple models for the crack tip applied stress profile.

    Keywords:

    crack propagation, stresses, residual stresses, X-ray diffraction, crack growth retardation, fatigue (materials), steels


    Author Information:

    Allison, JE
    Carnegie-Mellon University, Pittsburgh, Pa.


    Paper ID: STP34935S

    Committee/Subcommittee: E08.08

    DOI: 10.1520/STP34935S


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