SEDL / STP / STP677-EB / STP34935S



Measurement of Crack-Tip Stress Distributions by X-Ray Diffraction

Allison, JE
Carnegie-Mellon University, Pittsburgh, Pa.


Pages: 13    Published: Jan 1979


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Abstract

Crack-tip stress distributions were measured on the surface of fatigue-cracked specimens of 1045 steel using a semiautomatic X-ray diffraction technique. The influence of overload cycles and crack extension on crack-tip stress profiles was studied. These overload-influenced stress profiles were observed to follow current analytical models generally. Overload cycles were shown to have a strong effect on subsequent residual and applied stress profiles. It was deduced that overload-induced crack-tip residual stresses are tensile on the interior of the specimen, the implication being that crack growth retardation may thus be a surface related phenomenon. Crack tip applied stresses were also measured and were found to be consistent with simple models for the crack tip applied stress profile.


Keywords:
crack propagation, stresses, residual stresses, X-ray diffraction, crack growth retardation, fatigue (materials), steels

Paper ID: STP34935S
Committee/Subcommittee: E08.08
DOI: 10.1520/STP34935S
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