STP824

    Irradiation Creep and Growth During Proton and Neutron Bombardment of Zircaloy-2 Plate

    Published: Jan 1984


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    Abstract

    Proton irradiation creep and in-pile creep and growth tests have been conducted on specimens cut from the same rolled and annealed Zircaloy-2 plate. The proton irradiation creep tests were carried out over the following ranges: stress, 0 to 267 MPa; damage rate, 0.15 to 7.0 × 10−7 dpa/s; temperature, 513 to 613 K; and dose, up to 1.44 dpa.

    These data were analyzed in detail on the basis of single variable tests to give a phenomenological equation of the form ˙ϵϒ=˙G+Aσnφmexp(¯QRTq) where ˙ϵT = total strain rate, ˙G = growth rate, σ = applied stress, φ = damage rate, = growth rate, σ = applied stress, φ = damage rate, T = temperature, and A, n, m, Q, R, and q = material parameters.

    Over the range studied the stress and damage rate exponents were unity and the temperature dependence was best described with a q-value of 0.5. Longitudinal and transverse specimens exhibited a degree of creep anisotropy.

    Additional specimens were reactor preirradiated to a dose of 1.0 dpa and tested in the ion accelerator. The results of these tests were in excellent agreement with the equation.

    The in-pile tests were carried out at the following values: stress, 80 and 140 MPa; damage rate, 9.7 × 10−8 dpa/s; temperature, 543 to 593 K; and dose, up to 1.42 dpa. These tests also gave results that were in good agreement with the prediction of the equation.

    Keywords:

    Zircaloy-2, recrystallized, proton irradiation, neutron irradiation, irradiation growth, irradiation creep, stress, temperature, damage rate, dose, strain, strain rate, texture


    Author Information:

    Chapman, OJV
    Principal engineer, Rolls-Royce and Associates, Derby,

    McElroy, RJ
    Senior scientific officer, Metallurgy Division, AERE Harwell, Oxfordshire,

    Sheldon, BE
    Senior scientific officer, Metallurgy Division, AERE Harwell, Oxfordshire,


    Paper ID: STP34479S

    Committee/Subcommittee: B10.02

    DOI: 10.1520/STP34479S


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