STP547

    Chapter 4—Selected Area Electron Diffraction Analysis of Extraction Replica and Thin Foil Specimens in the Transmission Electron Microscope

    Published: Jan 1973


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    Abstract

    This procedure is intended as a guide for satisfactory selected area electron diffraction (SAED) analysis in the transmission electron microscope (TEM), of extraction replica and thin foil specimens. It is intended to help those who have a minimal understanding of crystallography but desire to use electron diffraction analysis for identification of precipitates or determination of their orientation (or orientation of other substructural features) relative to the matrix or both. A stepwise outline form is presented of the procedures to be followed without much theoretical background; however, a list of references1–6]2 is provided to supplement this procedure with as much theory as is desired. Two examples of the application of the procedure are also given.


    Paper ID: STP34140S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP34140S


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