Published: Jan 1973
| ||Format||Pages||Price|| |
|PDF (156K)||10||$25||  ADD TO CART|
|Complete Source PDF (1.5M)||10||$55||  ADD TO CART|
Small particles such as precipitates and included material in the matrix (such as inclusions) can be examined for shape, size, and distribution using the electron microscope. Thin surface films can also be examined. Using selected area electron diffraction, the particles or films can be identified if they are crystalline in form. Amorphous materials can not be identified by this technique because of diffuse and indistinct diffraction rings.