SEDL / STP / STP786-EB / STP33988S

Portable X-ray Survey Meters for In Situ Trace Element Monitoring of Air Particulates

Rhodes, JR
Columbia Scientific IndustriesInstitute of Physics and Nuclear Techniques, AustinKraków, Tex.

Stout, JA
Columbia Scientific IndustriesInstitute of Physics and Nuclear Techniques, AustinKraków, Tex.

Schindler, JS
ASOMA Instruments, Austin, Tex.

Piórek, S
Columbia Scientific IndustriesInstitute of Physics and Nuclear Techniques, AustinKraków, Tex.

Pages: 13    Published: Jan 1982

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Abstract

The use of new portable X-ray fluorescence instruments is described for nondestructive elemental analysis of air contaminants. Elements from silicon to uranium can be monitored in particulate deposits on filters. Most detection limits are in the range 0.1 to 1.0 µg element per square centimetre of deposit. These values translate to 1 to 10 µg/m³ for personal samplers operated at 2 L/min over an 8-h shift. They are 1 to 4 orders of magnitude below Permissible Exposure Limits for workplace air contaminants. This new capability should fill the need for rapid, on-site elemental analysis of air contaminants. Instruments can be employed for routine monitoring of breathing zones and work areas, for detecting fugitive emissions and for on-the-spot surveys of accidental releases of toxic materials.