SEDL / STP / STP666-EB / STP33967S



How to Interpret an Interferogram

Bissinger, HD
Technical specialist, Lawrence Livermore Laboratory, Livermore, Calif.


Pages: 18    Published: Jan 1978


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Abstract

This paper presents a method of interferogram reduction for reflected wavefront profiles measuring surface shape, transmitted wavefront profiles combining surface and homogeneity effects, surface irregularities or gradient errors per unit of clear aperture at normal incidence, and parallelism or wedge angle. Also included are several testing methods.


Keywords:
interferogram, interferometer, parallelism, gradient error, wavefront distortion

Paper ID: STP33967S
Committee/Subcommittee: F01.02
DOI: 10.1520/STP33967S
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