STP666: How to Interpret an Interferogram

    Bissinger, HD
    Technical specialist, Lawrence Livermore Laboratory, Livermore, Calif.

    Pages: 18    Published: Jan 1978


    Abstract

    This paper presents a method of interferogram reduction for reflected wavefront profiles measuring surface shape, transmitted wavefront profiles combining surface and homogeneity effects, surface irregularities or gradient errors per unit of clear aperture at normal incidence, and parallelism or wedge angle. Also included are several testing methods.

    Keywords:

    interferogram, interferometer, parallelism, gradient error, wavefront distortion


    Paper ID: STP33967S

    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP33967S


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