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Depth Profiling of Hydrogen Isotopes Implanted into TiC Crystals Pages: 9 Published: Jan 1987
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View License Agreement Source: STP955-EB Abstract The concentration depth profiles of hydrogen isotopes implanted into titanium carbide (TiCx) specimens in the composition range of x = 0.50 to 0.96 have been measured using the elastic recoil detection analysis. The retention behavior of the implanted deuterium changes with the specimen composition; the deuteriums deposit near the projected range, and a saturation is eventually reached for the specimens with the composition close to stoichiometric TiC, while for the specimens with off-stoichiometric compositions they diffuse very fast away from the near surface region to the interior to attain the saturation. The experimental data of retention and isotopic replacement are compared with a simple model of local saturation and replacement. Keywords: hydrogen isotopes, radiation, titanium carbide, deuterium Paper ID: STP33866S Committee/Subcommittee: E10.07 DOI: 10.1520/STP33866S ASTM International is a member of CrossRef. | ||