Digital Library / STP / STP955-EB / STP33866S



Depth Profiling of Hydrogen Isotopes Implanted into TiC Crystals

Sato, K
Associate professor,Miyagi National College of Technology,

Yamaguchi, S
Professor,Institute for Materials Research, Tohoku University,

Fujino, Y
Associate professor,Tohoku University,


Pages: 9    Published: Jan 1987


Download this paper for $25 PDF (152K)          View License Agreement
        Click here to download the complete source publication for $133 PDF (18M)


Source: STP955-EB


Abstract

The concentration depth profiles of hydrogen isotopes implanted into titanium carbide (TiCx) specimens in the composition range of x = 0.50 to 0.96 have been measured using the elastic recoil detection analysis. The retention behavior of the implanted deuterium changes with the specimen composition; the deuteriums deposit near the projected range, and a saturation is eventually reached for the specimens with the composition close to stoichiometric TiC, while for the specimens with off-stoichiometric compositions they diffuse very fast away from the near surface region to the interior to attain the saturation. The experimental data of retention and isotopic replacement are compared with a simple model of local saturation and replacement.


Keywords:
hydrogen isotopes, radiation, titanium carbide, deuterium

Paper ID: STP33866S
Committee/Subcommittee: E10.07
DOI: 10.1520/STP33866S
CrossRef ASTM International is a member of CrossRef.