STP955

    Depth Profiling of Hydrogen Isotopes Implanted into TiC Crystals

    Published: Jan 1987


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    Abstract

    The concentration depth profiles of hydrogen isotopes implanted into titanium carbide (TiCx) specimens in the composition range of x = 0.50 to 0.96 have been measured using the elastic recoil detection analysis. The retention behavior of the implanted deuterium changes with the specimen composition; the deuteriums deposit near the projected range, and a saturation is eventually reached for the specimens with the composition close to stoichiometric TiC, while for the specimens with off-stoichiometric compositions they diffuse very fast away from the near surface region to the interior to attain the saturation. The experimental data of retention and isotopic replacement are compared with a simple model of local saturation and replacement.

    Keywords:

    hydrogen isotopes, radiation, titanium carbide, deuterium


    Author Information:

    Sato, K
    Associate professor, Miyagi National College of Technology, Natori 981-12,

    Yamaguchi, S
    Professor, Institute for Materials Research, Tohoku University, Sendai 980,

    Fujino, Y
    Associate professor, Tohoku University, Sendai 980,


    Paper ID: STP33866S

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP33866S


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