STP557

    Transmission Electron Microscopy in Materials Research

    Published: Jan 1974


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    Abstract

    This paper very briefly reviews the development of transmission electron microscopy (TEM) including instrumentation and specimen preparation techniques, and generally describes typical examples of the use of TEM today in the study and understanding of the st ructure of materials. New observation techniques such as energy loss analysis, dark field imaging, the weak beam technique, Kikuchi line analysis, and computer generation of dislocation images are discussed. In addition to forefront work, many illustrations are given where TEM has greatly contributed to the optimization of properties and general improvement of many commercially important materials.

    Keywords:

    metallography, electron microscopy, energy loss analysis, electron diffraction, martensite, decomposition


    Author Information:

    Wells, MGH
    Technical director and staff microscopist, Crucible Materials Research Center, Colt Industries, Pittsburgh,

    Capenos, JM
    Technical director and staff microscopist, Crucible Materials Research Center, Colt Industries, Pittsburgh,


    Paper ID: STP33332S

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP33332S


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