SEDL / STP / STP798-EB / STP33215S

Exploratory Study of Crack-Growth-Based Inspection Rationale

Walker, EK
Senior scientist, Research and Development, Lockheed-California Company, Burbank, Calif.

Pages: 15    Published: Jan 1983

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Abstract

A relatively simple probabilistic model is developed having as its basic elements a log-normal representation of crack initiation and crack growth rates, the probability of crack detection, a crack growth curve, and a safety criterion based on a probability of residual strength equal to or less than limit load capability. Interrelationships between these model elements are explored through selected quantified examples. Some resulting internal relationships and trends are discussed.