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Simultaneous Determination of the Boron and Phosphorus Content in Silicate Glasses by FT-IR Spectroscopy Pages: 6 Published: Jan 1984
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View License Agreement Source: STP850-EB Abstract Fourier transform infrared spectroscopy can be used for the rapid determination of the boron and phosphorus concentrations in borophosphosilicate glass films. A multicomponent matrix algebraic method is used in this procedure. Results of the measurements on a number of BPSG samples are presented and the factors affecting the accuracies of the measurements are discussed. Keywords: FT-IR, borophosphosilicate glass films, silicon Paper ID: STP32666S Committee/Subcommittee: F01.06 DOI: 10.1520/STP32666S ASTM International is a member of CrossRef. | ||