SYMPOSIA PAPER Published: 01 January 1984
STP32541S

Simultaneous Multielement Determination of Trace Metal Impurities in Refined Copper by Argon Direct-Current Plasma Atomic Emission Spectroscopy (DCPAES)

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Development of the stable argon direct-current plasma atomic emission spectrometer has provided a rapid alternative technique for the simultaneous multi-element analysis of refined copper for trace metal impurities. The trace metals (bismuth, arsenic, antimony, selenium, tellurium, iron, tin, lead, and nickel) are determined in various refined copper matrices. Results of analyses of National Bureau of Standards' Standard Reference Materials 457 and 494–496 for trace metals agree well with the certificate values. Results between direct-current plasma atomic emission spectroscopy and spark emission spectroscopy for production samples of refined copper also agree.

Author Information

Jordan, DE
Extractive Metallurgical Research, Phelps Dodge Corporation, Morenci, Ariz.
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Details
Developed by Committee: B02
Pages: 166–172
DOI: 10.1520/STP32541S
ISBN-EB: 978-0-8031-4899-4
ISBN-13: 978-0-8031-0217-0