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Simultaneous Multielement Determination of Trace Metal Impurities in Refined Copper by Argon Direct-Current Plasma Atomic Emission Spectroscopy (DCPAES) Pages: 7 Published: Jan 1984
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View License Agreement Source: STP831-EB Abstract Development of the stable argon direct-current plasma atomic emission spectrometer has provided a rapid alternative technique for the simultaneous multi-element analysis of refined copper for trace metal impurities. The trace metals (bismuth, arsenic, antimony, selenium, tellurium, iron, tin, lead, and nickel) are determined in various refined copper matrices. Results of analyses of National Bureau of Standards' Standard Reference Materials 457 and 494–496 for trace metals agree well with the certificate values. Results between direct-current plasma atomic emission spectroscopy and spark emission spectroscopy for production samples of refined copper also agree. Keywords: argon direct-current plasma atomic emission spectroscopy, trace metal impurities, refined copper Paper ID: STP32541S Committee/Subcommittee: B02.09 DOI: 10.1520/STP32541S ASTM International is a member of CrossRef. | ||