STP822: Correcting Emission and Excitation Spectra: A Review of Past Procedures and New Possibilities Using Silicon Photodiodes

    Zalewski, EF
    Physicist, physicist, and chemist, National Bureau of Standards, Washington, D.C.,

    Geist, J
    Physicist, physicist, and chemist, National Bureau of Standards, Washington, D.C.,

    Velapoldi, RA
    Physicist, physicist, and chemist, National Bureau of Standards, Washington, D.C.,

    Pages: 9    Published: Jan 1983


    Abstract

    A brief review of procedures used to produce corrected excitation and emission spectra is given. Recent advances in silicon photodiodes as detector standards and the possibility of their use to produce both corrected excitation and emission spectra are discussed in more detail. The advantages in the use of the photodiodes based on accuracy, stability, simplicity of use, and extensive linear dynamic range will be reviewed.

    Keywords:

    corrected emission spectra, corrected excitation spectra, fluorescence, silicon photodetector standards, spectrofluorimetry, spectroradiometry


    Paper ID: STP31870S

    Committee/Subcommittee: E13.06

    DOI: 10.1520/STP31870S


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