SEDL / STP / STP708-EB / STP29238S

Contamination Control in Trace Element Analysis

Zief, M
Principal scientist for purification, J. T. Baker Chemical Company, Phillipsburg, N.J.

Pages: 12    Published: Jan 1980

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Abstract

Contamination problems inherent in analysis at the ultratrace (<1 µg/g) element level are reviewed. Suggestions for controlling systematic errors in the following parameters are offered: the sample, the laboratory, containers, and reagents.

The addition of the blanks contributed from each of these sources comprises the total analytical blank in an analysis. Inasmuch as high blanks invalidate most ultratrace analyses, reduction in the size and variability of the blank components is a major step in attaining higher accuracy.