STP911

    Photothermal Deflection Microscopy of HR and AR Coatings

    Published: Jan 1985


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    Abstract

    Last year at this syposium we reported on the initial results of photothermal deflection microscopy (PDM) studies of single layer dielectric thin films [1]. The high spatial resolution, low-level absorption capabilities of PDM were demonstrated in the form of two-dimensional absorption contour maps of such films.

    In this paper we report on PDM measurements of a number of HR and AR coatings provided by Lawrence Livermore Laboratory and the Naval Weapons Center. The absorption data obtained from these measurements provide the first phase of absorption/damage correlation studies and as these absorption measurements were recently completed, no correlation data are yet available.

    Resolution improvements, measurement methodology and a number of absorption contour maps are presented. Two interesting observations yet to be explained are described and some future experiments are suggested.

    Keywords:

    defect location, optical absorption, photothermal deflection, surface defects, thin films


    Author Information:

    Mundy, WC
    Pacific Union College, Angwin, CA

    Ermshar, JEL
    Pacific Union College, Angwin, CA

    Hanson, PD
    Pacific Union College, Angwin, CA

    Hughes, RS
    Pacific Union College, Angwin, CA


    Paper ID: STP28990S

    Committee/Subcommittee: F01.19

    DOI: 10.1520/STP28990S


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