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Photothermal Deflection Microscopy of HR and AR Coatings Pages: 12 Published: Jan 1985
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View License Agreement Last year at this syposium we reported on the initial results of photothermal deflection microscopy (PDM) studies of single layer dielectric thin films [1]. The high spatial resolution, low-level absorption capabilities of PDM were demonstrated in the form of two-dimensional absorption contour maps of such films. In this paper we report on PDM measurements of a number of HR and AR coatings provided by Lawrence Livermore Laboratory and the Naval Weapons Center. The absorption data obtained from these measurements provide the first phase of absorption/damage correlation studies and as these absorption measurements were recently completed, no correlation data are yet available. Resolution improvements, measurement methodology and a number of absorption contour maps are presented. Two interesting observations yet to be explained are described and some future experiments are suggested. | ||
