STP911

    1.06 Micron Laser Damage of Thin Film Optical Coatings — a Round Robin Experiment Involving Various Pulse Lengths and Beam Diameters

    Published: Jan 1985


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    Abstract

    A number of commercially available optical coatings, both antireflective and high reflective, have been tested for their laser induced damage threshold, involving a total of eight (8) different laboratories. The results obtained and the experimental methods used at these laboratories were discussed among the participants in this round robin at a minisymposium held at Balzers, Liechtenstein, December 9–10, 1982. A final report of the round robin and a summary of the conclusions drawn at that symposium are presented.

    Keywords:

    Laser Induced Damage Thresholds, Laser Optics, Optical Coatings, and Standardization of Laser Damage Measurements


    Author Information:

    Guenther, KH
    Quality Assurance Department, Balzers, AG

    Humpherys, TW
    European Office of Aerospace Research and Development, London,

    Balmer, J
    Institute for Applied Physics, University of Berne, Berne,

    Bettis, JR
    European Office of Aerospace Research and Development, London,

    Casparis, E
    Quality Assurance Department, Balzers, AG

    Ebert, J
    Institute for Quantum Optics, University of Hannover, Hannover,

    Eichner, M
    University of Kaiserslautern, Kaiserslautern,

    Guenther, AH
    Air Force Weapons Laboratory, United States Air Force, Kirtland AFB,

    Kiesel, E
    Institute for Quantum Optics, University of Hannover, Hannover,

    Kuehnel, R
    SI FR Ort EO, Siemens AG, Bereich Funk und Radiosysteme, Munich,

    Milam, D
    Lawrence Livermore National Laboratory, Livermore, CA

    Ryseck, W
    SI FR Ort EO, Siemens AG, Bereich Funk und Radiosysteme, Munich,

    Seitel, SC
    Michelson Laboratory, Naval Weapons Center, China Lake, CA

    Stewart, A
    Air Force Weapons Laboratory, United States Air Force, Kirtland AFB,

    Weber, H
    University of Kaiserslautern, Kaiserslautern,

    Weber, HP
    Institute for Applied Physics, University of Berne, Berne,

    Wirtenson, G
    Lawrence Livermore National Laboratory, Livermore, CA

    Wood, RM
    Hirst Research Centre, The General Electric Company, Ltd., East Lane, WembleyMiddlesex,


    Paper ID: STP28977S

    Committee/Subcommittee: F01.19

    DOI: 10.1520/STP28977S


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