SEDL / STP / STP911-EB / STP28970S

Single-shot, Cummulative and PRF Dependent Laser Induced Damage Thresholds

Wood, RM
GEC Research Laboratories, Hirst Research Centre, Wembley, Middlesex

Waite, P
GEC Research Laboratories, Hirst Research Centre, Wembley, Middlesex

Sharma, SK
GEC Research Laboratories, Hirst Research Centre, Wembley, Middlesex

Pages: 5    Published: Jan 1985

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Abstract

During the course of several laser damage programmes at HRC evidence has been accumulated on the different mechanisms and morphology of damage. This evidence has been gained at both 1.06 and 10.6 μm during single-shot, cummulative and prf testing of laser components.

This paper discusses, with both quantitative and photographic data the significance of (1) variation of the damage threshold values gained as a function of laser spot size and laser beam power and energy characteristics, and (2) the size and morphology of the damage spot gained under single shot, multiple and cummulative irradiation at prf's up to 100 Hz. Results are presented on Ge, ZnSe, ZnS, GaAs, CdTe, NaCl, KCl substrates and coated components at 10.6 μm and PMMA, fused silicon, Nd:laser glass and coated components at 1.06 μm.