STP911

    Damage Thresholds of Fused Silica, Plastics and KDP Crystals Measured with 0.6-ns 355-nm Pulses

    Published: Jan 1985


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    Abstract

    We used 355-nm, 0.6-ns pulses focused to a beam diameter of approximately 1 mm to measure the laser damage thresholds for surfaces of bare polished samples of several types of fused silica, for the bulk of crystals of potassium dihydrogen phosphate (KDP), and for a few plastics. Surface damage thresholds for fused silica ranged from 1–14 J/cm2, and were least for surfaces with residual subsurface polishing fractures. Thresholds for inclusion damage in KDP crystals were 2–4 J/cm2. Test volumes in these same crystals had thresholds from 2.5–7.0 J/cm2 when they were laser hardened by repeated subthreshold irradiation. FEP teflon films had thresholds of 3 J/cm2, which were the greatest threshold observed for a plastic.

    Keywords:

    UV laser damage, fused silica, potassium dihydrogen phosphate, teflon, laser hardening, subsurface polishing damage


    Author Information:

    Staggs, MC
    Lawrence Livermore National Laboratory, Livermore, CA

    Rainer, F
    Lawrence Livermore National Laboratory, Livermore, CA


    Paper ID: STP28960S

    Committee/Subcommittee: F01.11

    DOI: 10.1520/STP28960S


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