SEDL / STP / STP740-EB / STP28779S

Limitations of Direct Simple Shear Test Devices

La Rochelle, P
Professor, Laval University, Quebec

Pages: 6    Published: Jan 1981

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Abstract

The Direct Simple Shear (DSS) test devices have a major fundamental defect which has been recognized for over 40 years. In this paper, the limitations of the DSS test are emphasized by test results obtained on a highly sensitive and brittle clay of Eastern Canada. The DSS devices are no real improvement over the direct shear devices and the value of the triaxial test is far superior.