STP748

    Multi-Parameter Yield Zone Model for Predicting Spectrum Crack Growth

    Published: Jan 1981


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    Abstract

    A systematic technique is presented for modeling crack growth load interaction effects due to spectrum loading. The Multi-Parameter Yield Zone (MPYZ) model accounts for crack growth retardation, acceleration, and underload effects. The load interactions are attributed to the residual stress intensity due to the plastic deformation at the crack tip. As part of an ASTM Task Group E24.06.01 round-robin effort, fatigue crack growth was predicted and compared with test data for a variety of spectrum loadings.

    Keywords:

    spectrum loads, fatigue crack growth, load interaction, 2219-T851 aluminum, crack growth retardation, crack growth accelerations, underload effects


    Author Information:

    Johnson, WS
    Research engineer, NASA Langley Research Center, Hampton, Va.


    Paper ID: STP28335S

    Committee/Subcommittee: E08.06

    DOI: 10.1520/STP28335S


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