STP725

    A Study of Radiation Damage Produced in Thinned Specimens of 316 Stainless Steel by Energetic Helium Ions

    Published: Jan 1981


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    Abstract

    The evolution of radiation damage from the bubble formation stage to the surface blistering or exfoliation stage or both in 316 stainless steel irradiated with 80-keV helium ions was observed dynamically in high-voltage electron microscope. Exfoliation, which occurred at temperatures ≤570°C, in the electron transparent regions was observed to differ from bulk exfoliation in that it usually occurred in roughly circular patches. The diameter of these patches increased with increasing specimen thickness. More bulklike “sheet” exfoliations occurred in the thicker regions. The process started in the thicker regions and proceeded to the thinner regions. All exfoliation occurred on the beam-entrance side. Specimens irradiated at 650°C exhibited surface damage primarily consisting of blisters. The damage varied significantly with specimen thickness. In the thinnest regions, entire grains were bent so that the grain surface was concave on the beam-entrance side and convex on the beam-exit side. In slightly thicker regions, small-diameter (3 μm) blisters were observed on the beam-exit surface. The corresponding region on the beam-entrance surface showed little damage of any type. Following this region, in a yet thicker area, blisters were observed on both surfaces. In the thick bulklike regions, blisters were observed only on the beam-entrance surface.

    Keywords:

    radiation, stainless steels, helium ion bombardment, radiation effects, electron microscopy, blistering, exfoliation


    Author Information:

    Horton, LL
    Graduate research assistant and professor of materials science, University of VirginiaOak Ridge National Laboratory, CharlottesvilleOak Ridge, Va.Tenn.

    Jesser, WA
    Graduate research assistant and professor of materials science, University of VirginiaOak Ridge National Laboratory, CharlottesvilleOak Ridge, Va.Tenn.


    Paper ID: STP28241S

    Committee/Subcommittee: E10.08

    DOI: 10.1520/STP28241S


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