STP725: Correlation Between Microhardness, Tensile Properties, and Notch Ductility of Irradiated Ferritic Steels

    Mancuso, JF
    Senior engineer, fellow engineer, supervisor of Remote Metallographic Facility, and manager of reactor materials, Research Section, Nuclear Materials Department, Westinghouse R & D Center, Pittsburgh, Pa.

    Spitznagel, JA
    Senior engineer, fellow engineer, supervisor of Remote Metallographic Facility, and manager of reactor materials, Research Section, Nuclear Materials Department, Westinghouse R & D Center, Pittsburgh, Pa.

    Shogan, RP
    Senior engineer, fellow engineer, supervisor of Remote Metallographic Facility, and manager of reactor materials, Research Section, Nuclear Materials Department, Westinghouse R & D Center, Pittsburgh, Pa.

    Holland, JR
    Senior engineer, fellow engineer, supervisor of Remote Metallographic Facility, and manager of reactor materials, Research Section, Nuclear Materials Department, Westinghouse R & D Center, Pittsburgh, Pa.

    Pages: 11    Published: Jan 1981


    Abstract

    The work demonstrates that changes in Charpy V-notch impact properties can be monitored by microhardness measurements for radiation-embrittled ferritic steels in the transition region. A qualitative basis for understanding this relationship is developed from extension of existing models for lower-shelf fracture toughness and analysis of the shifts in the ductile-to-brittle transition temperature with changes in the yield strength. Microhardness is shown to correlate with the yield stress of the irradiated ferritic materials described in this report. A comparison of Charpy energy and yield stress data suggests that, for the purposes of this analysis, the fracture stress is insensitive to both irradiation and annealing in the transition region.

    Keywords:

    impact test, instrumented impact, dynamic test, microhardness, yield stress fracture properties, recovery, ferritic steel annealing, transition temperature, radiation, embrittlement


    Paper ID: STP28204S

    Committee/Subcommittee: E10.02

    DOI: 10.1520/STP28204S


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