STP747

    Background Correction Used with a High-Resolution Spectrometer for Plasma Emission Spectrochemical Analysis

    Published: Jan 1981


      Format Pages Price  
    PDF Version (164K) 13 $25   ADD TO CART
    Complete Source PDF (1.8M) 13 $55   ADD TO CART


    Abstract

    An echelle grating spectrometer can be configured in a straightforward fashion to provide short-range scanning. With this capability, the instrument enables observation of the wavelength regions a few spectral bandwidths on either side of an analyte line for the investigation of suspected spectral interferences. Acquisition of scan data of this sort can simplify the decision of whether or not to use some type of background correction procedure. Various background correction approaches are available with this short-range wavelength scan capability.

    The characteristics of a high-resolution echelle grating polychromator which has dynamic background correction capabilities is described. Its use for the elimination or alleviation of a number of suspected and verified cases of spectral interferences is examined.

    Keywords:

    metals, analytical techniques, trace constituents, echelle spectrometer, background correction techniques, atomic emission spectrometry, d-c plasma emission


    Author Information:

    Zander, AT
    Application engineer, SpectraMetrics, Inc., Andover, Mass.


    Paper ID: STP28096S

    Committee/Subcommittee: E03.02

    DOI: 10.1520/STP28096S


    CrossRef ASTM International is a member of CrossRef.