SYMPOSIA PAPER Published: 01 January 1981
STP28096S

Background Correction Used with a High-Resolution Spectrometer for Plasma Emission Spectrochemical Analysis

Source

An echelle grating spectrometer can be configured in a straightforward fashion to provide short-range scanning. With this capability, the instrument enables observation of the wavelength regions a few spectral bandwidths on either side of an analyte line for the investigation of suspected spectral interferences. Acquisition of scan data of this sort can simplify the decision of whether or not to use some type of background correction procedure. Various background correction approaches are available with this short-range wavelength scan capability.

The characteristics of a high-resolution echelle grating polychromator which has dynamic background correction capabilities is described. Its use for the elimination or alleviation of a number of suspected and verified cases of spectral interferences is examined.

Author Information

Zander, AT
SpectraMetrics, Inc., Andover, Mass.
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Details
Developed by Committee: E03
Pages: 64–76
DOI: 10.1520/STP28096S
ISBN-EB: 978-0-8031-4813-0
ISBN-13: 978-0-8031-0743-4