An Eddy Current Decay Technique for Low Temperature Resistivity Measurements

SEDL / STP / STP722-EB / STP27585S

An Eddy-Current Decay Technique for Low-Temperature Resistivity Measurements

Hartwig, KT
Assistant scientist, Engineering Experiment Station, University of Wisconsin, Madison, Wisc.

Pages: 16 Published: Jan 1981

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Abstract

The eddy-current decay technique developed by Bean for restivity determination is well suited for material characterization studies. The technique is shown to be an excellent method for determining the terminal solid-solution phase boundary in aluminum-gold (Al-Au), for following age hardening in dilute Al-Au alloys, and for detecting anisotropic electrical resistivity in cold-worked aluminum. Rapid and highly accurate restivities are measured with a basic circuit arrangement incorporating a digital oscilloscope.

Keywords:
aluminum, dilute alloy, eddy current, low temperature, phase boundary, precipitation, restivity, resistance, work hardening

Paper ID: STP27585S
Committee/Subcommittee: E07.10
DOI: 10.1520/STP27585S

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